PV Inspector

Andor’s PV Inspector NIR Camera is designed to offer ultimate speed and sensitivity performance for in-line Electro- and Photoluminescence Inspection, delivering > 90% QE beyond 800 nm and incorporating Fringe Suppression Technology™ to minimize fringing effects in the NIR

  • QE > 90% beyond 800 nm
  • 5 MHz and 3 MHz readout speeds
  • Dual Exposure Ring Mode
  • Fringe Suppression Technology ™
  • UltraVac™

PV Inspector

Andor’s PV Inspector NIR Camera is designed to offer ultimate speed and sensitivity performance for in-line Electro- and Photoluminescence Inspection, delivering > 90% QE beyond 800 nm and incorporating Fringe Suppression Technology™ to minimize fringing effects in the NIR. The 1024 x 1024 array boasts high resolution 13 μm pixels, and benefits from negligible darkcurrent with thermoelectric cooling down to -70°C. PV Inspector offers industry highest throughput via rapid readout speeds up to 5 MHz, combined with a unique ‘dual exposure ring mode’ that allows fast exposure switching. A lockable USB 2.0 port ensures secure vibration resistant connectivity.

The enhanced NIR sensitivity and unique high speed modes of the PV Inspector enable dual exposure EL inspection at rates in excess of 1 cell per second, ideally suited for very high throughput PV inspection systems as found in stringers and cell sorters. Rapid, dual exposure imaging, allows for quantitative measurement of cells under distinct bias levels.

Key Specifications
Active Pixels 1024 x 1024
Pixel Size 13 x 13 µm
Image Area 13.3 x 13.3 mm
Active area pixel well depth (typical) 100,000 e-
Output saturation 200,000 e-
Frame Rate 4.4 frames/sec at 5 MHz
Read Noise 9 e- at 3 MHz
Dual exposure cycle time 500 ms
Features Benefits
QE > 90% beyond 800 nm, optimized for NIR Very high detector sensitivity in near infra-red
5 MHz and 3 MHz readout speeds Rapid frame rates for high throughput cell inspection
Dual Exposure Ring Mode Unique acquisition mode for exposure time switching
Fringe Suppression Technology ™ Minimizes etaloning effects in the NIR, optimizes optical resolution
UltraVac™ Critical for sustained vacuum integrity and to maintain unequalled cooling and QE performance, year after year
Single AR-coated window design NIR optimized anti-reflection coating
Thermoelectric cooling to -70°C (air cooled) Critical for elimination of dark current detection limit
Lockable USB connection Ensures secure, vibration resistant connectivity
Cooling on power-up PV Inspector does not require PC connectivity to maintain stable thermoelectric cooling
Enhanced Baseline Clamp Essential for quantitative accuracy of dynamic measurements.
13 x 13 µm pixel size Optimal balance of dynamic range and resolution
Integrated shutter (optional) High dynamic range and 16-bit digitization available
Andor Solis software / SDK (Linux SDK available) Friendly Windows user interface offers intuitive acquisition optimization, system integration, automation and advanced data manipulation facilities
Halcon software interface Compatibility of PV Inspector acquisition modes with this powerful image processing library
Dual exposure cycle time 500 ms
Exposure switching time Negligible
QE @ 800nm > 90°C
Graphs and Drawings
QE Curve

Connector Panel 
 Dimensions - Front
 
 Dimensions - Side
 
 Dimension - Top

Multimedia Library
Application Images (2)
Product Photos (1)