Raman Explorer

The Raman Explorer™ family of multi-channel, multi-spectrum spectrographs is based on Headwall’s patented, aberration-corrected, retro-reflective concentric design – an innovative, high reciprocal dispersion instrument which is optimized for high signal throughput of weak Raman spectra with reduced measurement integration time.

  • High Signal Throughput
  • High Dynamic Range
  • High Spectral Resolution
  • High Spatial Resolution

Raman Explorer™ Spectrograph

Headwall Photonics

Complementing Andor's range of Imaging spectrographs we can now offer our customers a new solution offering spectral Imaging for more demanding Raman applications, developed by Headwall Photonics. The new agreement will allow us to offer the Raman Explorer™ with a choice of Andor detectors.

The Raman Explorer™ family of multi-channel, multi-spectrum spectrographs is based on Headwall's patented, aberration-corrected, retro-reflective concentric design – an innovative, high reciprocal dispersion instrument which is optimized for high signal throughput of weak Raman spectra with reduced measurement integration time. The unique design supports the ability to disperse multiple spectral ranges over a single CCD with superior resolution, photometric accuracy, and spectral bandwidth.

Key Specifications
Model 532 532 658 632.8 632.8 785 785
Parameter Units Ch 1 Ch 1 Ch 2 Ch 1 Ch 2 Ch 1 Ch 2
Laser stimulation λ nm 52 532 658 632.8 632.8 785 785
Minimum Stokes Shift cm-1 300 300 79 100 2982 -98 2256
Maximum Stokes Shift cm-1 3671 3671 2408 3072 4667 2419 3998
Avg. Recip. Linear Disp. cm-1/pixel 1.87 1.87 1.3 1.57 1.13 1.23 0.85
Nominal Spectral Resolution cm-1 5.6 5.6 3.9 4.7 3.4 3.7 2.6
Features & Benefits
100% increase in signal collection versus other straight line entrance aperture spectrometers
No image curvature
f/2.4
Original high efficiency imaging grating
No stray light “noise” commonly caused by transmissive optics, replicated diffraction gratings or multiple diffracted orders
< 4 cm-1 resolution with 785 nm excitation
Superb resolution over the entire focal plane
Superior 1:1 straight slit imaging
Maximum signal collection
Maximum multi-channel input capacity